Analysis and Detection

GRITEK has established an analytical and testing laboratory, equipped with a strong technical power, a professional talent team, advanced and complete equipment, and an improved quality management system. providing comprehensive, high-quality and efficient testing services. 

There are more than 60 sets of semiconductor material detection equipment in the laboratory, including four-probe resistivity testers, FTIR oxygen-carbon content testers, X-ray direction-finders, surface optoelectronic voltage testers, high-frequency photoconduction testers, total reflection fluorescence spectrometers, inductively coupled plasma mass spectrometers, and laser particle testers. The detection range covers crystal defects, crystal structures, chemical components, electrical performance, geometric accuracy, etc. various important semiconductor material parameters.

The laboratory has long been providing testing and standard sample preparation services for enterprises and research institutes.